The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2020

Filed:

Sep. 10, 2018
Applicant:

Sri International, Menlo Park, CA (US);

Inventors:

Karan Sikka, Lawrenceville, NJ (US);

Ajay Divakaran, Monmouth Junction, NJ (US);

Parneet Kaur, Westborough, MA (US);

Assignee:

SRI International, Menlo Park, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6263 (2013.01); G06K 9/623 (2013.01); G06K 9/627 (2013.01); G06N 3/08 (2013.01);
Abstract

Systems and methods for improving the accuracy of a computer system for object identification/classification through the use of weakly supervised learning are provided herein. In some embodiments, the method includes (a) receiving at least one set of curated data, wherein the curated data includes labeled images, (b) using the curated data to train a deep network model for identifying objects within images, wherein the trained deep network model has a first accuracy level for identifying objects, receiving a first target accuracy level for object identification of the deep network model, determining, automatically via the computer system, an amount of weakly labeled data needed to train the deep network model to achieve the first target accuracy level, and augmenting the deep network model using weakly supervised learning and the weakly labeled data to achieve the first target accuracy level for object identification by the deep network model.


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