The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2020

Filed:

Mar. 08, 2019
Applicant:

Nec Corporation, Tokyo, JP;

Inventor:

Shinichi Miyamoto, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/20 (2006.01); G06K 9/62 (2006.01); G06T 1/00 (2006.01); G06T 7/60 (2017.01);
U.S. Cl.
CPC ...
G06K 9/00838 (2013.01); G06K 9/00255 (2013.01); G06K 9/00261 (2013.01); G06K 9/209 (2013.01); G06K 9/2018 (2013.01); G06K 9/624 (2013.01); G06T 1/00 (2013.01); G06T 7/60 (2013.01); G06K 9/00832 (2013.01); G06T 2207/30242 (2013.01);
Abstract

The image processing system acquires a first image which includes a target object illuminated by both of a first light and a second light, the second light being generated by a light source that emit light in a specific wavelength band, and an external object illuminated by the first light but not illuminated by the second light. The system acquires a second image generated by photographing a range same as a range of the first image through a filter causing wavelength distribution of observed light for the second image to be different from wavelength distribution of observed light for the first image. The system generates a third image in which intensity of a figure of the external object is raised as compared to the first image; and a fourth image in which intensity of a figure of the external object is reduced as compared to the first image.


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