The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2020

Filed:

Aug. 22, 2018
Applicant:

Imperva, Inc., Redwood City, CA (US);

Inventors:

Avidan Reich, Tel-Aviv, IL;

Amichai Shulman, Tel-Aviv, IL;

Michael Cherny, Tel-Aviv, IL;

Assignee:

Imperva, Inc., San Mateo, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 29/06 (2006.01); G06F 21/57 (2013.01); G06F 21/56 (2013.01); G06F 16/21 (2019.01);
U.S. Cl.
CPC ...
G06F 21/57 (2013.01); G06F 16/217 (2019.01); G06F 21/566 (2013.01); G06F 2221/033 (2013.01);
Abstract

A method implemented by a security system for selectively triggering different ones of a plurality of database assessment scans for a database The method includes monitoring for occurrences of a first class of database operations that have been determined to require only rerunning subsets of the plurality of database assessment scans to determine whether results of the plurality of database assessment scan shave changed, responsive to detecting an occurrence of one or more database operations of the first class, selecting one or more of the subsets to be rerun based on which of the database operations of the first class occurred, and triggering performance of only the selected one or more of the subsets to determine whether the results of the plurality of database assessment scans have changed.


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