The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2020

Filed:

Apr. 07, 2020
Applicant:

Sas Institute Inc., Cary, NC (US);

Inventors:

Biruk Gebremariam, Cary, NC (US);

Mark Traccarella, Cary, NC (US);

Assignee:

SAS Institute Inc., Cary, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 40/00 (2012.01); G06F 17/16 (2006.01); G06N 20/00 (2019.01); G06F 7/58 (2006.01); G06F 8/41 (2018.01); G06F 17/11 (2006.01);
U.S. Cl.
CPC ...
G06F 17/16 (2013.01); G06F 7/588 (2013.01); G06N 20/00 (2019.01); G06F 8/44 (2013.01); G06F 17/11 (2013.01);
Abstract

A computing system defines transformed variable values for training a machine learning model. A data description is determined for each variable of a plurality of variables from observation vectors. A number of rare-levels is determined for any variable of the plurality of variables that has a nominal variable type. Bins that describe a cumulative distribution function are defined for each variable based on the data description determined for each variable and based on the number of rare-levels determined for any variable of the plurality of variables identified as the nominal variable type. A transformed value is determined for each variable and for each observation vector of the observation vectors using the bins defined for a respective variable of the plurality of variables. Each determined transformed value is written to a transformed dataset with a respective observation vector of the observation vectors.


Find Patent Forward Citations

Gebremariam, Biruk. (2020). Distributable feature analysis in model training system (U.S. Patent No. 10824694). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10824694

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