The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2020

Filed:

Nov. 15, 2016
Applicant:

Trifacta Inc., San Francisco, CA (US);

Inventors:

Sean Philip Kandel, San Francisco, CA (US);

Zain Asgar, San Francisco, CA (US);

Wei Zheng, San Carlos, CA (US);

Philip John Vander Broek, San Francisco, CA (US);

Assignee:

Trifacta Inc., San Francisco, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/215 (2019.01); G06F 16/22 (2019.01); G06F 16/28 (2019.01);
U.S. Cl.
CPC ...
G06F 16/215 (2019.01); G06F 16/221 (2019.01); G06F 16/285 (2019.01); G06F 2216/03 (2013.01);
Abstract

A system standardizes values that occur in large datasets before the dataset is analyzed. The system identifies values in a dataset that are similar to each other and associates those values with each other to form groups. The system determines a canonical value for each group of associated values. Within each group, the system replaces values that have been associated with each other with the canonical value for the group. As a result, the dataset is transformed into a dataset that has standardized values, and the standardized dataset is provided as input for analysis by a data analysis system. By standardizing the dataset in this manner, the data analysis system can process a larger portion of the dataset.


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