The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2020

Filed:

May. 26, 2020
Applicant:

Mesh Dynamics, Inc, Cupertino, CA (US);

Inventors:

Prasad Desphande, Bangalore, IN;

Venkatesh Ganti, Cupertino, CA (US);

Rahul Lahiri, Belmont, CA (US);

Ashoke Sudhakar, Bangalore, IN;

Ravi Vijay, Bikaner, IN;

Assignee:

Mesh Dynamics, Inc, Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06N 20/00 (2019.01); H04L 9/06 (2006.01); G06N 5/04 (2006.01); G06F 16/23 (2019.01);
U.S. Cl.
CPC ...
G06F 11/3688 (2013.01); G06F 11/3664 (2013.01); G06F 11/3684 (2013.01); G06F 11/3692 (2013.01); G06F 16/2379 (2019.01); G06N 5/04 (2013.01); G06N 20/00 (2019.01); H04L 9/06 (2013.01); H04L 2209/16 (2013.01);
Abstract

A system for testing of an application programming interface (API) is disclosed. The system includes a usage data collection source to track a trace identity associated with at least one message exchange pattern of the API using an end to end tracing (E2E) technique, captures usage data of an application in one or more modes, wherein the usage data corresponds to the trace identity. A usage data selection subsystem selects a predefined strata of usage data. A test case generation learning subsystem generates multiple test cases. A mocking subsystem use the trace identity to simulate the at least one message pattern associated with the usage data from a current version of the application against an updated version of the application. A comparison subsystem records an actual result, compares the actual result with an expected result and generates a test result upon comparison of the actual result with the expected result.


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