The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2020

Filed:

Oct. 27, 2017
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Assaf Natanzon, Tel Aviv, IL;

Ran Goldschmidt, Herzeliya, IL;

Jehuda Shemer, Kfar Saba, IL;

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/20 (2019.01); G06F 3/06 (2006.01); G06F 16/11 (2019.01); G06F 9/455 (2018.01);
U.S. Cl.
CPC ...
G06F 3/067 (2013.01); G06F 3/0604 (2013.01); G06F 16/128 (2019.01); G06F 2009/4557 (2013.01);
Abstract

Data protection appliances are provided for the protection of at least one virtual machine. A plurality of snapshots of at least one virtual machine are obtained. Each snapshot comprises (i) production data of the virtual machine, and (ii) a fine granularity data structure for changed data that is maintained in volatile memory and records metadata for input/output (I/O) operations corresponding to changed data. A metadata differential is generated by aggregating, for example, the fine granularity data structures for any time intervals since the prior snapshot that were flushed to a storage volume and included in the prior snapshot. The storage volume is replicated using the metadata differential. The snapshots optionally further comprise a coarse granularity bit map for changed data indicating whether corresponding blocks of data have changed.


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