The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2020
Filed:
Mar. 19, 2018
Universite Du Mans, Le Mans, FR;
Centre National DE LA Recherche Scientifique, Paris, FR;
Institut Mines Télécom (Imt) Atlantique Bretagne Pays DE LA Loire, Brest, FR;
Institut DE Recherche Technologique Jules Verne, Bouguenais, FR;
Julien Poittevin, La Milesse, FR;
Pascal Picart, Le Mans, FR;
Kevin Heggarty, Lanrivoare, FR;
Julien Le Meur, Plouzane, FR;
UNIVERSITE DU MANS, Le Mans, FR;
CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE, Paris, FR;
INSTITUT MINES TÉLÉCOM (IMT) ATLANTIQUE BRETAGNE PAYS DE LA LOIRE, Brest, FR;
INSTITUT DE RECHERCHE TECHNOLOGIQUE JULES VERNE, Bouguenais, FR;
Abstract
Some embodiments are directed to a system for measuring vibrations of a surface of a mechanical part, by digital holography. The system includes a source of radiation emitting in a predetermined range of frequencies, a first separator element configured to define a first incident ray and a reference ray, a module for shaping a second incident ray from the first incident ray, and an optical element configured to make the reference ray and a radiation produced by a reflection of the incident ray on the surface of the mechanical part interfere. The module for shaping the second incident ray includes diffracting optical elements having a diffraction structure to diffract the incident radiation. The structure is from a polymer, sol-gel or photoresin material resting against a glass substrate, the structure including elements etched in a plane parallel and/or orthogonal to the substrate, with dimensions from 100 nanometres to 100 micrometres.