The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2020
Filed:
Aug. 17, 2017
Applicant:
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Inventors:
Assignee:
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 9/47 (2006.01); G02B 21/36 (2006.01); G06T 5/20 (2006.01); G02B 21/08 (2006.01);
U.S. Cl.
CPC ...
G02B 21/365 (2013.01); G06T 5/20 (2013.01); G02B 21/082 (2013.01); G06T 2207/10056 (2013.01);
Abstract
A method for imaging in a microscope with oblique illumination includes illuminating an object by an illumination beam path that is obliquely incident on an object plane of the microscope. A microscopic image of the object and a corresponding digital image signal are produced. The digital image signal is processed by digital image processing using a convolution kernel to increase contrast. An increased-contrast digital image is produced from the processed digital image signal.