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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10823892 B1

PDFFull Text
Date of Patent:
Nov. 03, 2020

Filed:

Aug. 29, 2017

Device for testing optical properties and method for testing optical properties

Applicant:

Lg Chem, Ltd., Seoul, KR;

Inventors:

Min Yeong Jo, Daejeon, KR;

Jin Yong Park, Daejeon, KR;

Dong Min Park, Daejeon, KR;

Won Chul Lee, Daejeon, KR;

Ki Jun Jung, Daejeon, KR;

Assignee:

LG CHEM, LTD., Seoul, KR;

Attorney:

Dentons US LLP

Primary Examiner:

Md M Rahman

Int. Cl.
CPC ...
G01J 4/00 (2006.01); G02B 5/30 (2006.01); G01M 11/00 (2006.01); G01J 9/00 (2006.01); G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
G02B 5/3083 (2013.01); G01J 9/00 (2013.01); G01M 11/00 (2013.01); G01N 21/8806 (2013.01); G02B 5/30 (2013.01); G01J 2009/002 (2013.01); G01N 2021/8848 (2013.01);
Abstract

The present application relates to a device for testing optical properties and a method for testing optical properties using the same. The device of the present application has inexpensive manufacturing and maintenance costs, is capable of testing a wide range of plane directional phase differences, and provides the method for testing optical properties with improved identification efficiency of the phase retardation axis.

Find Patent Forward Citations

Jo, Min. (2020). Device for testing optical properties and method for testing optical properties (U.S. Patent No. 10823892). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10823892

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