The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2020

Filed:

Sep. 28, 2018
Applicant:

Siemens Healthcare Gmbh, Erlangen, DE;

Inventors:

Jin Qiang He, Shenzhen, CN;

Bin Kuang, Shenzhen, CN;

Jing Zhao, Shenzhen, CN;

Assignee:

Siemens Healthcare GmbH, Erlangen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/58 (2006.01); G01R 33/36 (2006.01); G01R 33/565 (2006.01);
U.S. Cl.
CPC ...
G01R 33/583 (2013.01); G01R 33/3664 (2013.01); G01R 33/5659 (2013.01);
Abstract

A digital mode matrix phase calibration includes acquiring an actual phase deviation θ'forming an actual phase deviation matrix θ′ of a factory system; calculating an ideal phase deviation forming an ideal phase deviation matrix; calculating a phase deviation of the actual phase deviation and the ideal phase deviation; acquiring a maximum value of the phase deviation; when the maximum value Δθis less than a preset threshold δ, calculating a field system phase deviation θ″, and a field system phase deviation matrix θ″ formed by the field system phase deviation θ″subjecting a field system to phase calibration. By acquiring only one row and one column in the phase deviation matrix, the technical solution in embodiments of the present invention can fit phase deviations of other rows and columns, and the method subjects the system to phase calibration quickly.


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