The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2020
Filed:
Aug. 24, 2018
Xilinx, Inc., San Jose, CA (US);
Andrew Tabalujan, Milpitas, CA (US);
Xiaobao Wang, Cupertino, CA (US);
Gubo Huang, Milpitas, CA (US);
XILINX, INC., San Jose, CA (US);
Abstract
Examples herein describe techniques for testing a receiver interface on a die. In one embodiment, the die includes tester circuitry which includes a digital to analog convertor (DAC) which outputs an analog test signal to a selector circuit (e.g., a multiplexer) which forwards the analog test signal to a receiver. By varying the analog test signal, the tester circuitry can identify one or more trip points corresponding to the receiver. That is, by monitoring the output of the receiver, a testing application can determine when the output of the receiver switches states thereby indicating that the analog test signal at the input of the receiver corresponds to the trip point of the receiver. In this manner, internal circuitry (e.g., the tester circuitry) can be used to test a receiver interface that may otherwise be inaccessible.