The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2020
Filed:
Aug. 06, 2014
Universität Basel, Basel, CH;
Marko Loparic, Basel, CH;
UNIVERSITÄT BASEL, Basel, CH;
Abstract
The invention relates to a sample holder () for holding a sample, particularly for use with an atomic force microscope. According to the invention, the sample holder () comprises: preferably a flexible support () having an upper side () and a lower side () facing away from said upper side (), a first and a second holding member (), wherein each holding member () comprises a first section () that is preferably connected to the upper side () of the flexible support (), as well as an opposing second section () forming a tip () of the respective holding member (), such that the holding members () are each movable from a first position, in which the tips () are positioned adjacent to one another, into a second position, in which the tips () are further apart from each other than in said first positions and are separated by a gap (G) for receiving at least a portion of the sample (S) to be held, and wherein said tips () are designed to penetrate the sample (S) or to press against it so as to hold it when the sample (S) is received by said gap (G) and the holding members () are moved back from the second positions into the first positions.