The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2020
Filed:
Aug. 07, 2018
Applicant:
Texas Instruments Incorporated, Dallas, TX (US);
Inventors:
Dat Tan Nguyen, Murphy, TX (US);
Robert Milotta, Wylie, TX (US);
Assignee:
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/28 (2006.01); G01N 29/06 (2006.01); G01N 29/44 (2006.01);
U.S. Cl.
CPC ...
G01N 29/28 (2013.01); G01N 29/0681 (2013.01); G01N 29/4427 (2013.01); G01N 2291/0231 (2013.01);
Abstract
A system for scanning and analyzing a device wider test includes a transducer. The transducer transmits ultrasonic waves to scan the device under test and determine various properties (e.g., material of layers). The system further includes a heating/cooling portion. The heating/cooling portion conducts thermal stress testing on the device under test to accentuate areas of delamination between layers. The transducer then performs scans on the device under test to locate areas of delamination.