The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2020
Filed:
Aug. 03, 2016
Applicant:
Uhv Technologies, Inc., Fort Worth, TX (US);
Inventors:
Nalin Kumar, Fort Worth, TX (US);
Manuel Gerardo Garcia, Jr., Lexington, KY (US);
Assignee:
UHV Technologies, Inc., Fort Worth, TX (US);
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/223 (2006.01); G01N 33/15 (2006.01);
U.S. Cl.
CPC ...
G01N 23/223 (2013.01); G01N 33/15 (2013.01); G01N 2223/076 (2013.01); G01N 2223/652 (2013.01);
Abstract
A system and method for detecting, measuring, and analyzing for metallic impurities in pharmaceutical drugs and compounds utilizes an x-ray fluorescence system. The system and method may be co-located with a pharmaceutical manufacturing process for in-line continuous monitoring of metal impurities. The pharmaceutical products may be in a form selected from a powder, slurry, pill, tablet, and gel.