The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2020

Filed:

Nov. 07, 2017
Applicant:

Nuctech Company Limited, Beijing, CN;

Inventors:

Ankai Wang, Beijing, CN;

Hongqiu Wang, Beijing, CN;

Yumin Yi, Beijing, CN;

Haihui Liu, Beijing, CN;

Jianhong Zhang, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/44 (2006.01); G01N 21/65 (2006.01);
U.S. Cl.
CPC ...
G01N 21/65 (2013.01); G01N 2201/0642 (2013.01);
Abstract

The present disclosure relates to a non-contact type security inspection and method, the system including: a laser source for emitting probe light beams which penetrate through a container or a packaging and are irradiated onto an inspected object contained in the container or the packaging; an optical collection device for collecting an exciting light excited by the probe light beams on the inspected object; a spectrum analyzer for analyzing spectral characteristics of the exciting light collected by the optical collection device so as to determine characteristics of the inspected object; and a shielding apparatus for preventing at least part of the exciting light excited by the probe light beams on the container or the packaging from entering an induction area of the optical collection device.


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