The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2020
Filed:
May. 29, 2018
Applicant:
Nikon Corporation, Tokyo, JP;
Inventors:
Assignee:
NIKON CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); G02B 21/16 (2006.01); G02B 21/08 (2006.01); G02B 21/12 (2006.01); G02B 21/06 (2006.01); H04N 5/225 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6458 (2013.01); G01N 21/64 (2013.01); G02B 21/06 (2013.01); G02B 21/082 (2013.01); G02B 21/125 (2013.01); G02B 21/16 (2013.01); H04N 5/225 (2013.01);
Abstract
A microscope, including: an illumination optical system that irradiates a specimen with illumination light from an oblique direction; an observation optical system including an objective lens; and a controller that moves at least one of a stage to hold the specimen and the objective lens in a same direction as an optical axis of the objective lens. The controller changes, when moving at least one of the stage and the objective lens, an incident angle of the illumination light with respect to the specimen.