The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2020

Filed:

Aug. 26, 2016
Applicant:

Tricorntech Taiwan, Taipei, TW;

Inventors:

Tsung-Kuan A. Chou, San Jose, CA (US);

Chien-Lin Huang, Sinjhuang, TW;

Li-Peng Wang, Taipei, TW;

Assignee:

TRICORNTECH TAIWAN, Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 30/86 (2006.01); G01N 1/26 (2006.01); G01N 30/88 (2006.01); G01N 33/00 (2006.01); G01N 1/02 (2006.01); G01N 30/02 (2006.01);
U.S. Cl.
CPC ...
G01N 1/26 (2013.01); G01N 30/88 (2013.01); G01N 33/0031 (2013.01); G01N 33/0075 (2013.01); G01N 2001/021 (2013.01); G01N 2030/025 (2013.01); G01N 2030/8881 (2013.01);
Abstract

Embodiments of an apparatus comprising a plurality of multiple-gas analysis devices positioned within a relevant area, each multiple-gas analysis device capable of detecting the presence, concentration, or both, of one or more gases. A data and control center is communicatively coupled to each of the plurality of multiple-gas analysis device, the data and control system including logic that, when executed, allows the data and control center to monitor readings from the plurality of multiple-gas analysis devices and if any readings indicate the presence of one or more contaminants, identifying the source of the contaminants based on the readings from the plurality of multiple-gas analysis devices.


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