The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2020
Filed:
Nov. 09, 2015
Commscope Asia Holdings B.v., DG Bussum, NL;
Sander Johannes Floris, EC Lennisheuvel, NL;
Ton Bolhaar, BP Ophemert, NL;
Bastiaan Pieter De Hon, DB Eindhoven, NL;
COMMSCOPE ASIA HOLDINGS B.V., DG Bussum, NL;
Abstract
A method for testing optical fibers includes using an optical testing instrument to measure a characteristic, such as clad non-circularity, of an optical fiber at a multiple angles of rotation of an optical fiber around its optical axis. From the measurements data points indicative of measured values of the characteristic at the respective angles of rotation are generated. A model is created of the optical fiber having the characteristic as a variable parameter, and from the model a functional relationship between an expected measured value of the characteristic and the angle of rotation and the variable parameter is generated. By varying the parameter a fit of the functional relationship to the data points is made according to one or more predetermined criteria, such as least-squares fit. The value of the characteristic can be found based on the fit. Instrumental parameters, such as fiber misalignment and cleave angle, can also be ascertained by the method.