The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2020

Filed:

Oct. 16, 2018
Applicant:

Samsung Electronics Co., Ltd., Gyeonggi-do, KR;

Inventors:

Daniel Babitch, San Jose, CA (US);

Kuangmin Li, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01K 7/32 (2006.01); H03L 1/02 (2006.01); H03L 1/04 (2006.01); G01S 19/01 (2010.01);
U.S. Cl.
CPC ...
G01K 7/32 (2013.01); G01S 19/01 (2013.01); H03L 1/022 (2013.01); H03L 1/04 (2013.01);
Abstract

A method and system for generating a crystal model for a test product including a crystal oscillator are herein disclosed. The method includes measuring a first temperature of the test product and measuring a first frequency error of the crystal oscillator at a first calibration point during a product testing process, measuring a second temperature of the test product and measuring a second frequency error of the crystal oscillator at a second calibration point during the product testing process, estimating two parameters from the first temperature, first frequency error, second temperature, and second frequency error, and determining a 3order polynomial for the crystal model based on the two parameters.


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