The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2020

Filed:

Jul. 25, 2019
Applicant:

Dr. Johannes Heidenhain Gmbh, Traunreut, DE;

Inventors:

Karsten Sändig, Palling, DE;

Walter Huber, Traunstein, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/14 (2006.01); G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
G01B 11/14 (2013.01); G01B 9/0201 (2013.01);
Abstract

In an optical position measuring device for the interferential determination of the relative distance of two objects which are movable relative to each other in at least one measuring direction, a bundle of rays emitted by a light source is split up into at least two partial bundles of rays, which fall on a grating or a plurality of gratings on separate optical paths and undergo distance-dependent phase shifts as a result. The partial bundles of rays are superpositioned at a mixing grating, whereupon at least three pairs of interfering partial bundles of rays propagate in different directions in space. Via the mixing grating, each pair of interfering partial bundles of rays is focused on a detector element so that at least three position-dependent, phase-shifted incremental signals are detectable via the detector elements.


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