The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2020
Filed:
Jun. 30, 2017
Hitachi, Ltd., Tokyo, JP;
Kohhei Aida, Tokyo, JP;
Masahiro Kawasaki, Tokyo, JP;
Shunsuke Mori, Tokyo, JP;
Hiroshi Sasaki, Tokyo, JP;
Yuya Tokuda, Tokyo, JP;
HITACHI, LTD., Tokyo, JP;
Abstract
A quality control system includes a control device, an output device, and an input device placed at at least an end point of a distribution channel of articles; the input device includes an input unit for receiving data on a changed environment portion and a communication unit that transmits the data, information about an input location, and an input time to the control device. The control device includes a storage unit for storing the mode of packing of the articles in the distribution channel, a reception unit for receiving the information from the input device, an arithmetic operation unit that calculates the number of articles deviating from the storage environment and estimates the stage of the distribution channel deviating from the storage environment, and a transmission unit for transmitting calculation result to the output device that is provided with a display unit.