The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2020
Filed:
Oct. 26, 2018
Applicant:
Mitaka Kohki Co., Ltd., Tokyo, JP;
Inventor:
Yusuke Nakata, Tokyo, JP;
Assignee:
MITAKA KOHKI CO., LTD., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 90/25 (2016.01); A61B 90/50 (2016.01); G02B 21/00 (2006.01); G02B 21/24 (2006.01); G02B 7/00 (2006.01);
U.S. Cl.
CPC ...
A61B 90/25 (2016.02); A61B 90/50 (2016.02); G02B 21/0012 (2013.01); G02B 21/248 (2013.01); A61B 2090/504 (2016.02); G02B 7/001 (2013.01); G02B 21/24 (2013.01);
Abstract
A surgical microscope system includes a surgical microscope. When an additional unit is added to the microscope, the center of gravity of the microscope upwardly changes. In this case, an extension of a vertical-slider plate is joined with an upper joint location of a horizontal-slider plate, to raise a vertical slider together with a rotary shaft relative to the microscope, so that a weight balance of the microscope can be established only by sliding the vertical slider within its slidable range.