The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 2020
Filed:
May. 03, 2018
Method and apparatus for light and computer vision based dimensional metrology and 3d reconstruction
Yang LI, Georgetown, MA (US);
Helmar Adler, Danvers, MA (US);
Sergio Bermudez, Boston, MA (US);
OSRAM SYLVANIA Inc., Wilmington, MA (US);
Abstract
Systems and methods disclosed herein includes a measurement device to enable dimensional metrology and/or 3D reconstruction of an object. The measurement device is positioned between the object and reference luminaires (e.g., light emitting diodes or other light sources). The measurement device uses the reference luminaires to determine the position and orientation of the measurement device. The measurement device may include a camera oriented towards the reference luminaires and may acquire/use images of reference luminaires to determine the position and orientation of the measurement device. Using the reference luminaires, the system may determine positions and orientations of the measurement device when the images of the reference luminaires are taken. The system may be configured to use the positions and the orientations of the measurement device to determine dimensions and/or 3D models of the object.