The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2020

Filed:

Jan. 15, 2019
Applicant:

Litepoint Corporation, Sunnyvale, CA (US);

Inventors:

Christian Volf Olgaard, Saratoga, CA (US);

Ruizu Wang, Santa Clara, CA (US);

Kaiyun Cui, San Jose, CA (US);

Assignee:

LitePoint Corporation, San Jose, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04L 12/26 (2006.01); H04B 17/318 (2015.01);
U.S. Cl.
CPC ...
H04L 43/50 (2013.01); H04B 17/318 (2015.01);
Abstract

System and method for testing transmission and reception performance of a data packet signal transceiver device under test (DUT). Data packet signals transmitted by a tester with a tester transmit output power (TTOP) contain trigger frames that include data corresponding to a reported tester transmit power (RTTP) of the data packet signals, and a desired received signal strength (TRSS) of DUT data packet signals to be received by the tester. Based on received signal strength of the tester data packet signals reported by the DUT (DRSS), responsive DUT data packet signals having a DUT transmit output power of RTTP−DRSS+TRSS. Successive repetitions of such tester and DUT data packet signals for multiple combinations of values of the TTOP, RTTP and DRSS enable testing transmission and reception performance of the DUT, including determining minimum and maximum DUT transmission power levels, with minimal signal interactions between tester and DUT.


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