The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2020

Filed:

Apr. 10, 2017
Applicant:

Credo Technology Group Limited, Grand Cayman, KY;

Inventors:

Xike Liu, Shanghai, IN;

Yifei Dai, Shanghai, IN;

Assignee:

Credo Technology Group Limited, Grand Cayman, KY;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/552 (2006.01); H01L 23/00 (2006.01); H01L 23/538 (2006.01); H01L 23/498 (2006.01); H01L 23/64 (2006.01); H03B 5/12 (2006.01); H01F 17/00 (2006.01); H04L 7/00 (2006.01);
U.S. Cl.
CPC ...
H01L 23/552 (2013.01); H01F 17/0013 (2013.01); H01L 23/49816 (2013.01); H01L 23/5384 (2013.01); H01L 23/5385 (2013.01); H01L 23/5386 (2013.01); H01L 23/645 (2013.01); H01L 24/16 (2013.01); H01L 24/81 (2013.01); H03B 5/1212 (2013.01); H03B 5/1228 (2013.01); H04L 7/0008 (2013.01); H01F 2017/002 (2013.01); H01F 2017/008 (2013.01); H01L 2224/16227 (2013.01); H01L 2224/81801 (2013.01); H01L 2924/3025 (2013.01);
Abstract

Disclosed microelectronic assemblies employ an integrated interposer cage to reduce electromagnetic interference with (and from) high-frequency components. One illustrative embodiment includes: at least one IC die having drive cores for a plurality of oscillators, the IC die attached in a flip-chip configuration to a (interposer) substrate, the substrate having: multiple inductors electrically coupled to said drive cores and each enclosed within a corresponding conductive cage integrated into the substrate to reduce mutual coupling between the inductors and noise coupled through substrate. An illustrative interposer embodiment includes: upper contacts arranged to electrically connect with micro bumps on at least one IC die; metallization and dielectric layers that form multiple inductors each surrounded by bars of a conductive cage; lower contacts arranged to electrically connect with bumps on a package substrate; and a substrate with a plurality of TSVs (through-silicon vias) that electrically couple to the lower contacts. Each of the bars includes: at least one of said TSVs, at least one via through the metallization and dielectric layers, and at least one upper contact.


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