The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2020

Filed:

Sep. 13, 2019
Applicant:

SK Hynix Inc., Gyeonggi-do, KR;

Inventors:

Wenwei Wang, San Jose, CA (US);

Bin Li, San Jose, CA (US);

Satish Pratapneni, Milpitas, CA (US);

Assignee:

SK hynix Inc., Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/02 (2006.01); G11C 29/50 (2006.01); G11C 11/56 (2006.01); G06F 11/30 (2006.01); G06F 11/07 (2006.01); G11C 11/4074 (2006.01);
U.S. Cl.
CPC ...
G11C 29/021 (2013.01); G06F 11/0772 (2013.01); G06F 11/3037 (2013.01); G11C 11/4074 (2013.01); G11C 11/565 (2013.01); G11C 29/50004 (2013.01); G11C 2029/5006 (2013.01);
Abstract

Techniques related to monitoring a health of a capacitor array of an SSD are described. In an example, a direct leakage current check is performed by determining voltages of the capacitor array at different times, computing a resistance of the capacitor array based on the voltages, and generating health data for the capacitor array based on the resistance. In another example, an indirect leakage current check is performed by determining at least one of: a number of times a voltage maintaining process is performed within a predefined time duration or a time difference between repeating the voltage maintaining process, comparing the at least one of the number of times or the time difference and a threshold, and generating the health data based on the comparison of the at least one of the number of times or the time difference and the threshold.


Find Patent Forward Citations

Loading…