The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2020

Filed:

Nov. 24, 2017
Applicant:

Ajou University Industry-academic Cooperation Foundation, Suwon-si, KR;

Inventors:

Kyung Won Lee, Seoul, KR;

Hyo Ji Ha, Seoul, KR;

Hyun Woo Han, Suwon-si, KR;

Sung Yun Bae, Seongnam-si, KR;

Ji Hye Lee, Bucheon-si, KR;

Chang Hyung Hong, Seongnam-si, KR;

Sang Joon Son, Seoul, KR;

Hyun Jung Shin, Seongnam-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 15/00 (2011.01); G06T 11/20 (2006.01); G06T 19/00 (2011.01); G06K 9/62 (2006.01); G06F 16/00 (2019.01); G16H 50/70 (2018.01);
U.S. Cl.
CPC ...
G06T 15/00 (2013.01); G06F 16/00 (2019.01); G06K 9/6218 (2013.01); G06T 11/206 (2013.01); G06T 19/00 (2013.01); G16H 50/70 (2018.01);
Abstract

Provided is a method of visualizing a plurality of nodes respectively including a plurality of variable values for a data object. The method includes: allocating a predetermined upper limit value and a predetermined lower limit value for each of a plurality of variables to vertices of a three-dimensional polygon facing each other; respectively determining partial positions related to the variables for the nodes based on the upper limit value and the lower limit value for each of the variables, a maximum variable value and a minimum variable value for each variable from among variable values of the nodes, and the variable values of the nodes; respectively determining final positions of the nodes in the three-dimensional polygon based on the determined partial positions; and arranging the nodes in the three-dimensional polygon according to the determined final positions.


Find Patent Forward Citations

Lee, Kyung. (2020). Visualization method and device for multi-dimensional data analysis (U.S. Patent No. 10818066). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10818066

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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