The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2020

Filed:

Nov. 03, 2016
Applicant:

Robert Bosch Gmbh, Stuttgart, DE;

Inventors:

Rumi Ghosh, Palo Alto, CA (US);

Charmgil Hong, Pittsburgh, PA (US);

Soundararajan Srinivasan, San Francisco, CA (US);

Assignee:

Robert Bosch GmbH, Stuttgart, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 16/22 (2019.01); G06F 16/2457 (2019.01); G05B 23/02 (2006.01); G05B 19/042 (2006.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G05B 19/042 (2013.01); G05B 23/0275 (2013.01); G06F 16/2246 (2019.01); G06F 16/24578 (2019.01); G05B 2219/2629 (2013.01);
Abstract

Methods, systems, and apparatuses for performing target parameter analysis for an assembly line including a plurality of stations. One method includes receiving, with an electronic processor, training data associated with the assembly line. The training data including a plurality of attributes. The method also includes receiving, with the electronic processor, value addition data for each of the plurality of stations. The value addition data for each of the plurality of stations specifying a non-negative value added by each of the plurality of stations. The method also includes learning, with the electronic processor, a decision tree based on the training data and the value addition data. The method also includes performing the target parameter analysis based on the decision tree.


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