The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 2020
Filed:
Feb. 13, 2017
Xia Llc, Hayward, CA (US);
William K. Warburton, Oakland, CA (US);
Wolfgang G. Hennig, Fremont, CA (US);
XIA LLC, Hayward, CA (US);
Abstract
A digital processing technique for measuring a characteristic of a digitized electronic signal pulse, particularly including its time of arrival and/or maximum. The technique is particularly suited for in-line implementation in a field programmable gate array or digital signal processor. For each detected pulse, one or more ratios are created from values of the pulse above baseline, obtained from regions of the pulse where the values change as its arrival time offset changes, and the ratio or ratios are used as variables in a reference table or equation to generate the value of the desired characteristic. The table or equation is created beforehand by using a secondary technique to study pulses of the type being measured, to establish the relationship between the ratio value or values and the desired characteristic, and to codify that relationship in the reference table or equation. Time resolutions of 2-3% of the sampling interval are demonstrated.