The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2020

Filed:

May. 16, 2019
Applicant:

Kepco Engineering & Construction Company, Inc., Gyeongsangbuk-do, KR;

Inventors:

Ho Bin Yim, Daejeon, KR;

Jae Young Huh, Daejeon, KR;

Gyu Cheon Lee, Daejeon, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); G06F 11/32 (2006.01); G06F 11/34 (2006.01); G06K 9/32 (2006.01); G06F 16/901 (2019.01);
U.S. Cl.
CPC ...
G06F 11/079 (2013.01); G06F 11/323 (2013.01); G06F 11/3461 (2013.01); G06K 9/3241 (2013.01); G06F 16/9027 (2019.01);
Abstract

Provided is a method of tracing a common cause failure in an integrated drawing. The method includes: synthesizing entities assigned attributes in at least one design drawing in units of a system where a common cause is to be traced; generating an integrated drawing with a hierarchical structure by horizontally or vertically interconnecting the entities assigned the same attribute in the at least one design drawing; and displaying a fault propagation path in the integrated drawing by using an internal tracer, wherein the displaying illustrates state information of the entities on the fault propagation path.


Find Patent Forward Citations

Yim, Ho. (2020). Method and apparatus for tracing common cause failure in integrated drawing (U.S. Patent No. 10817366). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10817366

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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