The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 2020
Filed:
Feb. 25, 2020
Tamr, Inc., Cambridge, MA (US);
Daniel Meir Bruckner, San Francisco, CA (US);
Gideon Goldin, Cambridge, MA (US);
Matthew Holzapfel, Bedford, MA (US);
Nicolas Malfroy-Camine, Wakefield, MA (US);
TAMR, INC., Cambridge, MA (US);
Abstract
Structured metadata is automatically captured regarding issues reported by a user when the user interacts with application software for presentation, analysis, or management of structured data. The reported issues correspond to structured data that is displayed by the application software. During user interaction with the application software, a user interface display screen is presented that includes one or more fields for reporting an issue with respect to structured data that is presently being displayed by the application software. Structured metadata is then automatically captured related to the reported issue. The structured metadata includes at least a location within the structured data for the reported issue. Records are stored of each reported issue in a database. Each record includes the reported issue, and the automatically captured structured metadata related to the reported issue.