The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2020

Filed:

Nov. 29, 2018
Applicant:

Alcorix Co., Plainfield, IL (US);

Inventor:

Nicolaie A. Moldovan, Plainfield, IL (US);

Assignee:

ALCORIX CO., Plainfield, IL (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02B 5/18 (2006.01); H01L 21/321 (2006.01); H01L 21/768 (2006.01); G21K 1/06 (2006.01); G02B 3/08 (2006.01); C23C 16/455 (2006.01);
U.S. Cl.
CPC ...
G02B 5/1876 (2013.01); C23C 16/45555 (2013.01); G02B 3/08 (2013.01); G21K 1/062 (2013.01); G21K 1/067 (2013.01); H01L 21/32115 (2013.01); H01L 21/7684 (2013.01); G21K 2201/067 (2013.01);
Abstract

A batch processing method for fabrication of diffractive optics is disclosed, having applicability to high resolution ultra-high aspect ratio Fresnel Zone Plates for focusing of X-rays or gamma-rays having energies up to hundreds of keV. An array of precursor forms comprising columns is etched into a planar substrate. After sidewall smoothing, a nanolaminate, comprising a sequence of alternating layers of different complex refractive index, is deposited on the sidewall of each column by atomic layer deposition (ALD), to define a specified diffractive line pattern around each column, to form a binary or higher order diffractive optic. After front surface planarization and thinning of the substrate to expose first and second surfaces of the diffractive line pattern of each diffractive optic, the height h in the propagation direction provides a designed absorption difference and/or phase shift difference between adjacent diffractive lines. Optionally, post-processing enhances mechanical, thermal, electrical and optical properties.


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