The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2020

Filed:

Jul. 10, 2018
Applicant:

Lockheed Martin Corporation, Bethesda, MD (US);

Inventors:

Arul Manickam, Bethesda, MD (US);

Peter G. Kaup, Bethesda, MD (US);

Gregory Scott Bruce, Bethesda, MD (US);

Assignee:

LOCKHEED MARTIN CORPORATION, Bethesda, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/26 (2006.01);
U.S. Cl.
CPC ...
G01R 33/26 (2013.01);
Abstract

A system for magnetic detection of an external magnetic field is described. The system includes a controller configured to control components of the system. The controller is configured to control an optical excitation source and a RF excitation source to apply pulse sequences to a magneto-optical defect center material such that in the excitation pulses of a first pair of RF excitation pulses have a first phase difference, the excitation pulses of a second pair of RF excitation pulses have a second phase difference, and the second phase difference is different from the first phase difference. The controller computes a combined magnetometry curve as a function of the RF excitation frequency based on a difference between a measured value of a first light detection signal and a measured value of a second light detection signal. The controller sets the first phase difference and the second phase difference based on the combined magnetometry curve.


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