The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2020

Filed:

May. 14, 2019
Applicants:

Andrew Norman Erickson, Santa Barbarba, CA (US);

Kyle Alfred Hofstatter, Santa Barbara, CA (US);

Inventors:

Andrew Norman Erickson, Santa Barbarba, CA (US);

Kyle Alfred Hofstatter, Santa Barbara, CA (US);

Assignee:

Angstrom Science, Inc., Santa Barbara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01Q 60/38 (2010.01);
U.S. Cl.
CPC ...
G01Q 60/38 (2013.01);
Abstract

This specification discloses a method and implementations improving the field of holding or mounting Scanning Probe Microscopy probe tips for use and alignment. Specifically, the invention allows probes to be mounted replaceably to a very small SPM actuator and aligned in 5 axis permitting alignment of cantilever to beam and reflected beam to detector. The invention allows for great simplification of SPM design while allowing reduction in sizes and masses of tip mounting apparatus thereby improving performance.


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