The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 2020
Filed:
Aug. 07, 2017
Applicant:
University of South Carolina, Columbia, SC (US);
Inventor:
Paul Henry Ziehl, Irmo, SC (US);
Assignee:
University of South Carolina, Columbia, SC (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/44 (2006.01); G01M 99/00 (2011.01); G01N 29/04 (2006.01); G01N 29/14 (2006.01); G01N 29/24 (2006.01); H04W 84/18 (2009.01);
U.S. Cl.
CPC ...
G01N 29/4409 (2013.01); G01M 99/008 (2013.01); G01N 29/04 (2013.01); G01N 29/14 (2013.01); G01N 29/2437 (2013.01); G01N 29/2481 (2013.01); G01N 2291/0231 (2013.01); G01N 2291/0251 (2013.01); G01N 2291/0258 (2013.01); G01N 2291/2694 (2013.01); H04W 84/18 (2013.01);
Abstract
A non-intrusive monitoring method and system for the detection and potential assessment of damage that may occur during a manufacturing process is described. Potential damage events such as impact events can be detected by one or more sensors located on a workpiece or on a machine utilized in the manufacturing process. Through wireless monitoring of the sensors, potential damage events are detected and products of the manufacturing process can be examined to determine if the event has led to damage.