The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2020

Filed:

Mar. 22, 2017
Applicant:

Commissariat a L'energie Atomique ET Aux Energies Alternatives, Paris, FR;

Inventors:

Lionel Herve, Corenc, FR;

Cedric Allier, Grenoble, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/14 (2006.01); G03H 1/04 (2006.01); G03H 1/08 (2006.01); G01N 15/10 (2006.01);
U.S. Cl.
CPC ...
G01N 15/1434 (2013.01); G01N 15/1429 (2013.01); G01N 15/1475 (2013.01); G03H 1/0443 (2013.01); G03H 1/0866 (2013.01); G01N 2015/1006 (2013.01); G01N 2015/144 (2013.01); G01N 2015/1454 (2013.01); G03H 2001/045 (2013.01); G03H 2001/0447 (2013.01); G03H 2001/0452 (2013.01); G03H 2001/0454 (2013.01); G03H 2001/0816 (2013.01);
Abstract

The invention relates to a method for observing a sample (), comprising the illumination of the sample using a light source () and the acquisition of an image (Io) of the sample using an image sensor (), the sample being disposed between the image sensor and the light source. Iterative steps are applied to the acquired image (Io), also referred to as a hologram, comprising: a single iterative numerical propagation (h), such as to estimate a complex image (A) of the sample in a reconstruction plane (P) or in a detection plane (P), in which the image sensor extends. The complex image can be used for the characterisation of the sample.


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