The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 2020
Filed:
Dec. 13, 2016
Fukuda Co., Ltd., Tokyo, JP;
FUKUDA CO., LTD., Tokyo, JP;
Abstract
It is an object of the present invention to provide same results of leak judgments even if conditions such as temperature and pressure vary as long as sizes of sealing defects are same. A leak devicethat generates regular leakage under regular temperature and pressure is made communicable with a test paththrough which a test pressure is provided. A device actual measurement leak value of the leak deviceis actually measured by a leakage measuring instrument. An object actual measurement leak value of a test objectis actually measured by the leakage measuring instrument. The object actual measurement leak value is converted into a regular-conditions-converted leak value based on the device actual measurement leak value and a leakage is judged based on the regular-conditions-converted leak value.