The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 2020
Filed:
Mar. 08, 2017
Jgc Japan Corporation, Yokohama, JP;
Masahiro Kawano, Kanagawa, JP;
Takeshi Kojima, Kanagawa, JP;
Yasubumi Kato, Kanagawa, JP;
Megumi Tazawa, Kanagawa, JP;
Yimeng Xu, Kanagawa, JP;
JGC JAPAN CORPORATION, Yokohama, JP;
Abstract
A leakage inspection method and leakage inspection device for container to be inspected are provided. When a container to be inspected having a deformable flexible part is to be inspected for leakage, the container to be inspected is filled with an inspection gas containing helium, the container to be inspected, which has been filled with the inspection gas, is disposed in an inspection chamber partitioned from the outside, and an upward flow of a carrier gas is formed from the lower part to the upper part of the container to be inspected. A leakage of the inspection gas filled in the container to be inspected is then detected on the basis of the result of measuring the concentration of helium in the carrier gas collected at a position higher than a position where the carrier gas is fed into the inspection chamber.