The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2020

Filed:

Oct. 02, 2017
Applicant:

Microsanj, Llc, Santa Clara, CA (US);

Inventors:

Dustin Kendig, Fremont, CA (US);

Ali Shakouri, West Lafayette, IN (US);

Hamid Piroozi, Fishers, IN (US);

Assignee:

MICROSANJ, LLC, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01); G01N 25/18 (2006.01); G01J 3/32 (2006.01); G01J 3/10 (2006.01); H04N 5/365 (2011.01); H04N 5/33 (2006.01); G01J 5/02 (2006.01); G01J 5/00 (2006.01); H04N 17/00 (2006.01);
U.S. Cl.
CPC ...
G01J 3/2823 (2013.01); G01J 3/10 (2013.01); G01J 3/32 (2013.01); G01J 5/0096 (2013.01); G01J 5/025 (2013.01); G01J 5/026 (2013.01); G01N 25/18 (2013.01); H04N 5/33 (2013.01); H04N 5/3651 (2013.01); G01J 2005/0048 (2013.01); G01J 2005/0077 (2013.01); H04N 17/002 (2013.01);
Abstract

A method for providing a high spatial resolution thermal imaging of an active electronic device. The method includes placing an electronic device on a testing stage of an imaging system. The method, calibrating the imaging system by determining thermoreflectance coefficient for a plurality of pixels forming thermal images, each pixel having a coordinate (x,y) captured from the electronic device at each of a plurality of wavelengths of illumination (C(x,y,λ), activating the electronic device, and determining changes in reflection for each of the plurality of pixels at each of the plurality of wavelengths (ΔR/R), determining ΔR/R vs. C(x,y,λ) for each of the plurality of pixels for each of the plurality of wavelengths, fitting ΔR/R vs. C(x,y,λ) to a predetermined mathematical function and use the parameters to calculate the temperature at each pixel.


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