The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2020

Filed:

Nov. 02, 2018
Applicant:

Kaiser Optical Systems Inc., Ann Arbor, MI (US);

Inventors:

Jeremy David Preister, Fenton, MI (US);

Joseph B. Slater, Dexter, MI (US);

Michael G. Stidham, Ann Arbor, MI (US);

Assignee:

Kaiser Optical Systems Inc., Ann Arbor, MI (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
F16J 15/14 (2006.01); G01N 21/64 (2006.01); G01D 11/26 (2006.01); G01N 21/85 (2006.01);
U.S. Cl.
CPC ...
G01D 11/26 (2013.01); F16J 15/14 (2013.01); G01N 21/8507 (2013.01); G01N 2201/0227 (2013.01);
Abstract

An improved method of sealing a window into an aperture in a body uses a lubricant comprising polytetrafluoroethylene (PTFE) particles suspended in a volatile, low viscosity, low surface tension carrier fluid. The carrier fluid is applied to one or both of the sidewalls of the window and aperture, and the window is pressed into the aperture such that the carrier fluid evaporates, leaving the PTFE particles to fill interstitial surface voids, while enabling the sidewall of the window to make intimate mechanical contact with the sidewall of the aperture. While having broader application, the present disclosure finds particular utility in optical characterization techniques based upon the Raman effect and fluorescence probes used in process monitoring and control.


Find Patent Forward Citations

Loading…