The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 2020
Filed:
Aug. 30, 2017
Mitsubishi Heavy Industries, Ltd., Tokyo, JP;
Misaki Fukuyama, Tokyo, JP;
Akio Kondo, Tokyo, JP;
Tomoyuki Onishi, Tokyo, JP;
Takahiro Miyamoto, Tokyo, JP;
MITSUBISHI HEAVY INDUSTRIES, LTD., Tokyo, JP;
Abstract
A clearance measurement device is for measuring a clearance between an inner peripheral surface of a cylindrical casing and an outer peripheral surface of a rotating member configured to rotate in the casing. The clearance measurement device includes a marker provided to the outer peripheral surface; an optical sensor attached to the casing, and configured to emit light toward the outer peripheral surface, receive light reflected from the rotating member, and detect the marker based on a change in amount of the received reflected light; and a measurement controller configured to perform signal processing on signals from the sensor. The sensor includes light reception fibers disposed such that optical axes intersect and having a measurement region on the outer peripheral surface, and planar light sources provided in a row along a rotating direction and each configured to emit light in a manner overlapping with the measurement region.