The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10816320 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 27, 2020

Filed:

Oct. 04, 2017
Applicants:

Sumitomo Mitsui Construction Co, Ltd., Tokyo, JP;

Kyushu University, National University Corporation, Fukuoka, JP;

Inventors:

Kentaro Tokura, Tokyo, JP;

Naoki Nagamoto, Tokyo, JP;

Takao Kakehashi, Tokyo, JP;

Motohiro Ikehara, Tokyo, JP;

Hideaki Uchiyama, Fukuoka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/00 (2006.01); E04G 15/06 (2006.01); G01C 15/06 (2006.01); G01S 17/89 (2020.01); E04B 1/19 (2006.01);
U.S. Cl.
CPC ...
G01B 11/00 (2013.01); E04G 15/06 (2013.01); G01C 15/06 (2013.01); G01S 17/89 (2013.01); E04B 2001/1948 (2013.01);
Abstract

[Problem] When inspecting whether each sleeve is in the correct position, to alleviate the burden on an operator and reduce the inspection time. [Solution] When an operator captures an image of a reference markeror a sleeve markerusing a camera C, the image is sent to a sleeve marker position analyzing meansfor the position of each sleeve marker, . . . to be analyzed. Then, a sleeve marker position assessing meansassesses whether the position of each sleeve marker, . . . is suitable, by superimposing the resulting analysis data and a BIM model stored in a BIM model storage means. Since it is sufficient for the operator to capture an image of the reference markeror the sleeve markerusing the camera C, the burden on the operator can be alleviated, and the inspection time can also be reduced.


Find Patent Forward Citations

Tokura, Kentaro. (2020). Sleeve position inspecting device and sleeve position inspecting method (U.S. Patent No. 10816320). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10816320

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