The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 2020
Filed:
Sep. 05, 2019
Hamamatsu Photonics K.k., Hamamatsu-shi, Shizuoka, JP;
Toyohiko Yamauchi, Hamamatsu, JP;
Osamu Yasuhiko, Hamamatsu, JP;
Hidenao Yamada, Hamamatsu, JP;
Hisayuki Matsui, Hamamatsu, JP;
HAMAMATSU PHOTONICS K.K., Hamamatsu-shi, Shizuoka, JP;
Abstract
A measurement apparatus includes an interference image acquisition unit, a fluorescence image acquisition unit, an operation unit, and a timing control circuit. The operation unit generates an optical thickness image based on an interference image acquired by the interference image acquisition unit, generates a mask image showing a region in which pixel values in a fluorescence image acquired by the fluorescence image acquisition unit are larger than a threshold value, and determines an integrated value of an optical thickness in the region shown by the mask image in the optical thickness image.