The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2020

Filed:

Jan. 15, 2016
Applicant:

The University of Tokyo, Tokyo, JP;

Inventors:

Kenjiro Hanaoka, Tokyo, JP;

Yu Kagami, Tokyo, JP;

Tetsuo Nagano, Tokyo, JP;

Yasuteru Urano, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C09B 11/26 (2006.01); G01N 33/52 (2006.01); C12Q 1/04 (2006.01); C07F 7/12 (2006.01); C09K 11/06 (2006.01); G01N 21/80 (2006.01); G01N 33/48 (2006.01); C07F 7/10 (2006.01); C07F 7/08 (2006.01); C09B 11/28 (2006.01); G01N 21/77 (2006.01);
U.S. Cl.
CPC ...
C09B 11/26 (2013.01); C07F 7/0812 (2013.01); C07F 7/10 (2013.01); C07F 7/12 (2013.01); C09B 11/28 (2013.01); C09K 11/06 (2013.01); C12Q 1/04 (2013.01); G01N 21/80 (2013.01); G01N 33/48 (2013.01); G01N 33/52 (2013.01); C09K 2211/1018 (2013.01); G01N 2021/7786 (2013.01);
Abstract

Fluorescent probes and their salts have high fluorescence quantum yield and high resistance to photobleaching suitable for visualizing various pH environments within cells such as weakly basic, neutral, and weakly acidic environments. The fluorescent probes can have the following structure:


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