The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2020

Filed:

Apr. 06, 2018
Applicant:

Fanuc Corporation, Minamitsuru-gun, Yamanashi, JP;

Inventors:

Kaimeng Wang, Yamanashi, JP;

Wenjie Chen, Yamanashi, JP;

Kouichirou Hayashi, Yamanashi, JP;

Assignee:

Fanuc Corporation, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2019.01); B25J 9/16 (2006.01);
U.S. Cl.
CPC ...
B25J 9/1664 (2013.01); B25J 9/1633 (2013.01); B25J 9/1697 (2013.01);
Abstract

A device that can prevent a decrease in an efficiency of a manufacturing line. The device includes a shape acquisition section for acquiring a shape of a workpiece; a motion pattern acquisition section for acquiring basic motion patterns including a reference workpiece shape, a reference working position in the reference workpiece shape, and a type of an operation carried out on the reference working position; a similarity determination section for determining whether a shape of the workpiece is similar to the reference work piece shape; a position determination section for, based on a shape of the workpiece and the reference workpiece shape, determining the working position on the workpiece that corresponds to the reference working position; and an motion-path generation section for, by changing the reference working position to the determined working position, generating a motion path.


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