The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2020

Filed:

Sep. 13, 2016
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Donnell Eugene Crear, Simpsonville, SC (US);

Ray Joshua Bohon, Campobello, SC (US);

Steven Charles Woods, Easley, SC (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B29C 67/00 (2017.01); B22F 3/105 (2006.01); B29C 64/393 (2017.01); B22F 3/00 (2006.01); B33Y 30/00 (2015.01); B33Y 50/02 (2015.01); B23K 26/342 (2014.01); G01N 1/10 (2006.01); G01N 33/00 (2006.01);
U.S. Cl.
CPC ...
B22F 3/1055 (2013.01); B22F 3/003 (2013.01); B22F 3/008 (2013.01); B23K 26/342 (2015.10); B29C 64/393 (2017.08); B33Y 30/00 (2014.12); B33Y 50/02 (2014.12); G01N 1/10 (2013.01); G01N 33/00 (2013.01); B22F 2003/1056 (2013.01); B22F 2003/1057 (2013.01); G01N 2033/0091 (2013.01); Y02P 10/25 (2015.11);
Abstract

Various aspects include systems and methods for analyzing materials in additive manufacturing processes. In some cases, a system includes: an additive manufacturing (AM) printer for printing an AM object, the AM printer including a raw material chamber and a build chamber; a control system coupled with the AM printer configured to control the printing of the AM object; and a material analysis system coupled with the control system and the AM printer, the material analysis system configured to analyze a raw material obtained directly from at least one of the raw material chamber or the build chamber for a defect prior to, or contemporaneously with, additively manufacturing the AM component.


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