The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2020
Filed:
Dec. 04, 2019
Applicant:
Spectrum Effect Inc., Kirkland, WA (US);
Inventors:
Jungnam Yun, Kirkland, WA (US);
Eamonn Gormley, Kirkland, WA (US);
Assignee:
Spectrum Effect Inc., Kirkland, WA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/08 (2009.01); H04W 72/08 (2009.01); H01Q 1/24 (2006.01); H04B 17/318 (2015.01); H04W 64/00 (2009.01);
U.S. Cl.
CPC ...
H04W 72/082 (2013.01); H01Q 1/246 (2013.01); H04B 17/318 (2015.01); H04W 24/08 (2013.01); H04W 64/00 (2013.01);
Abstract
A method for determining the location of a source of interference applies data in the vertical dimension to determine the probability of the source being located at various locations, or pixels. The data in the vertical dimension may be used to determine three-dimensional antenna gain for antenna-pixel pairs, and to determine whether a line of sight exists between the antenna-pixel pairs. Probability values are determined for the pixels using one or both of the line of sight information and antenna gain values.