The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2020

Filed:

Oct. 26, 2017
Applicant:

Sony Corporation, Tokyo, JP;

Inventors:

Yasutaka Hirasawa, Tokyo, JP;

Yuhi Kondo, Tokyo, JP;

Hideki Oyaizu, Tokyo, JP;

Shun Kaizu, Kanagawa, JP;

Teppei Kurita, Tokyo, JP;

Tuo Zhuang, Kanagawa, JP;

Ying Lu, Kanagawa, JP;

Hajime Mihara, Kanagawa, JP;

Assignee:

SONY CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/238 (2006.01); H04N 5/217 (2011.01); H04N 5/232 (2006.01); H04N 5/225 (2006.01);
U.S. Cl.
CPC ...
H04N 5/238 (2013.01); H04N 5/217 (2013.01); H04N 5/225 (2013.01); H04N 5/232 (2013.01);
Abstract

An image processing device and a method that enable removal of reflection component light from images captured from various directions are provided. The image processing device includes: an image input unit that acquires at least three types of images formed with polarization images of different polarizing directions or non-polarization images; an angle input unit that outputs reflection angles that are the angles between the image capturing directions of the acquired images and the plane direction corresponding to the normal direction of the reflecting surface, to an intensity transmittance and intensity reflectance calculation unit; a calculation unit that calculates the respective intensity transmittances and the respective intensity reflectances of S waves and P waves, using the reflection angles; and a reflection component separation unit that removes the reflected light component from the images acquired by the image input unit, using the respective intensity transmittances and the respective intensity reflectances of the S waves and P waves. These processes enable removal of reflected light components from captured images having various reflection angles.


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