The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2020

Filed:

Jul. 02, 2019
Applicant:

Semiconductor Components Industries, Llc, Phoenix, AZ (US);

Inventor:

Richard Scott Johnson, Boise, ID (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/232 (2006.01); H04N 9/04 (2006.01); H04N 5/225 (2006.01); H04N 9/64 (2006.01);
U.S. Cl.
CPC ...
H04N 5/23229 (2013.01); H04N 5/2254 (2013.01); H04N 5/2258 (2013.01); H04N 9/04551 (2018.08); H04N 9/64 (2013.01); H04N 2209/045 (2013.01);
Abstract

An imaging device may have an array of image sensor pixels. The array of image sensor pixels may have main pixels and reference pixels that are overlapped by optical stacks. The reference pixels may be more resistant to weathering, such as solar degradation, than the main pixels. For example, optical stacks overlapping the main pixels may include antireflection coatings, while optical stacks overlapping the reference pixels may not include antireflection coatings. Alternatively or additionally, the optical stacks overlapping the main pixels may include color filter resist formed from a first pigment, and the optical stacks overlapping the reference pixels may include color filter resist formed from a second pigment that is more resistant to weathering than the first pigment. Processing circuitry may compare outputs of the main pixels and the reference pixels to determine whether pixels in the array have been damaged.


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